Our services are designed to meet the most challenging measurement requirements
and to give customers the technical edge needed to be truly world-class.
The Panasonic UA3P profilometer series is designed to measure aspherical lenses & molds, semiconductor wafers, and any other precision component requiring nanometer level accuracy ranging up to 2.3 nanometers over the 200 mm measurement range.
This 3D profilometer is tailored for extremely accurate measurement of high-precision components. The present technology has led to the advent of nanotechnology or free-form surface components, which could not be previously developed or manufactured due to lack of measurement equipment capability.
Fujinon laser interferometer allows non-contact observation of mirror-surface parts that are made of any materials and have any reflection factors. It is equipped with a fringe analysis device which makes an automatic analysis of interference fringes into numerical values. High-performance laser interferometer system.
The MM-60 boasts stage travel of 200mm on the X-axis, 150mm on the Y-axis, and 200mm on the Z-axis. Three-stage coarse/fine focusing controls and other features make the MM-60 even easier to use. Photomicrographic and CCTV equipment, point sensors, and other accessories can be attached to the phototube of an Optical Head. And the Focusing Aid enables swift, reliable focusing for Z-axis measurements. A telecentric aperture improves the performance of the diascopic illuminator.
Optical Head : Erect image trinocular; inclined 25o from horizontal
Eyepiece : CFWN 10x
Objective : Measurescope objectives: 1x, 3x, 5x, 10x, 20x, 50x, 100x
Focusing Aide : (provided with MM-60/L3FA)
Stage : 8x6, 6x4, 4x4, O3L, 2x2
Max. Specimen Height : 200mm
Light Source : 12V50W halogen fiber-optic surface & contour illuminator built-in
Weight : 55kg (approx. 120lbs)
U-4100 is the highest-end model achieving high accuracy of which "Famous Hitachi Photometer" is proud.
U-4100 is a high-achiever in the measurement of fixed samples, and allows accurate measurement of polarization properties. This graph shows the reflectivity measurement results at an incident angle of 45° for a YAG laser, showing the reflection properties of S- and P-polarized lights from the mirror of a microfabricator. Each reflectivity is almost 100% at 1064nm.
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light.
The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
Accurate measurement of surface reflectivity can be performed without the costly steps that are typically needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block out all out of focus light reflection similar to a confocal system. Whether your optical component is spherical, aspherical or flat the USPM-RU III does not require sample prep through anti-reflection treatments
The SH-241 achieves superb performance in a compact size, and attains temperatures as low as –40o, with capacity of 22.5L. The SH-241 provides high performance and quality features with new capabilities for integration with our information network system. It is useful for centralized control and data processing, as well as operating chamber control and specimen measurement at the same time. The SH-241 can also be used for MIL-STD-810 testing.